Discover how the latest version of the PolyWorks|Inspector™ Gauge R&R workflow lets you certify and improve your 3D measurement process performed through its universal metrology platform.
Learn how to integrate a CAD model revision with PMI within a piece measurement template in PolyWorks|Inspector™ in minutes instead of hours, using our PolyWorks|PMI+Loop™ MBD solution for CAD software.
Discover how the inspection project data lifecycles delivered by the PolyWorks Digital Ecosystem accelerate the engineering phase of a new product, automate the propagation of CAD design changes, and help build strong long-term know-how and expertise within a manufacturing organization.
Discover how to perform multipiece feature-based inspections without a usable CAD representation more efficiently, with probing guidance plus feature scanning guidance and automatic feature extraction, thanks to the measurement guides technology introduced in PolyWorks|Inspector™ 2022.
Transform collision-free 3-axis CNC CMM sequences into optimal 5-axis sequences by efficiently integrating 5-axis moves and head touch probing.
Discover how manufacturing companies can gradually deploy the PolyWorks 3D metrology digital ecosystem to avoid disturbing operations and obtain efficiency gains at every step of their digital transformation journey.
See how we made the transformation and understand how the PolyWorks enterprise solution can directly contribute to enhancing your company’s competitivity and increasing the value of your expertise.
With this new technology, scan your parts and quickly display surface imperfections. Detect bumps, dents, and scratches, monitor part degradation over time, and locate missing functional elements, such as spot welds or rivets.
Learn how to efficiently measure and control sheet metal freeform cutouts and part sections by using the enhanced polyline creation and extraction tools along with the new GD&T-compliant line profile tool.
Discover how probing an object using multiple steps can greatly increase the flexibility and power of your measurement sequences with faster run times.